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Optical Engineering

X-ray tube voltage dependence of Wiener spectra of quantum mottle obtained by determining detective quantum efficiencies of a screen
Author(s): Hidetaka Arimura; Takeshi Ikari; Mitsuhide Okamoto; Nobuyuki Nakamori; Hitoshi Kanamori; Hideaki Kubota; Masao Matsumoto; Atsushi Takigawa
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Paper Details

Date Published: 1 April 1996
PDF: 12 pages
Opt. Eng. 35(4) doi: 10.1117/1.601008
Published in: Optical Engineering Volume 35, Issue 4
Show Author Affiliations
Hidetaka Arimura, Shimadzu Corp. (Japan)
Takeshi Ikari, Kyoto Institute of Technology (Japan)
Mitsuhide Okamoto, Kyoto Institute of Technology (Japan)
Nobuyuki Nakamori, Kyoto Institute of Technology (Japan)
Hitoshi Kanamori, Kyoto Institute of Technology (Japan)
Hideaki Kubota, Shiga Univ. (Japan)
Masao Matsumoto, Osaka Univ. (Japan)
Atsushi Takigawa, Osaka Univ. (Japan)


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