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Optical Engineering

Sub-Nyquist interferometry: implementation and measurement capability
Author(s): John E. Greivenkamp; Andrew E. Lowman; Russell J. Palum
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Paper Details

Date Published: 1 October 1996
PDF: 8 pages
Opt. Eng. 35(10) doi: 10.1117/1.600991
Published in: Optical Engineering Volume 35, Issue 10
Show Author Affiliations
John E. Greivenkamp, Univ. of Arizona (United States)
Andrew E. Lowman, Optical Sciences Ctr./Univ. of Arizona (United States)
Russell J. Palum, Eastman Kodak Co. (United States)

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