Share Email Print

Optical Engineering

Touchless interferometric dimension comparator
Author(s): Marek Dobosz; Hirokazu Matsumoto; Shige Iwasaki
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

A touchless interference method that can be used to calibrate gauge blocks or length bars with lengths from 0.01 mm up to 1 m is proposed. The method is based on a comparison of two gauges, with one of them used as a reference. Polychromatic synthesized light from three laser diodes is used to determine end surface positions. Distances referring to these positions are measured by a wavelength-stabilizedlaser interferometer. Error sources are analyzed in this method. The accuracy of the comparison depends on the accuracy of the interferometer used to measure displacement. In the case of long gauge blocks, accuracy is limited mainly by uncertainty in the gauge block temperature.

Paper Details

Date Published: 1 February 1996
PDF: 6 pages
Opt. Eng. 35(2) doi: 10.1117/1.600920
Published in: Optical Engineering Volume 35, Issue 2
Show Author Affiliations
Marek Dobosz, Warsaw Univ. of Technology (Poland)
Hirokazu Matsumoto, National Research Lab. of Metrology (Japan)
Shige Iwasaki, National Research Lab. of Metrology (Japan)

© SPIE. Terms of Use
Back to Top