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Optical Engineering

Measurement of x-ray telescope mirrors using a vertical scanning long trace profiler
Author(s): Haizhang Li; Xiaodan Li; Manfred W. Grindel; Peter Z. Takacs
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Paper Details

Date Published: 1 February 1996
PDF: 9 pages
Opt. Eng. 35(2) doi: 10.1117/1.600900
Published in: Optical Engineering Volume 35, Issue 2
Show Author Affiliations
Haizhang Li, Continental Optical Co. (United States)
Xiaodan Li, Continental Optical Corp. (United States)
Manfred W. Grindel, Continental Optical Corp. (United States)
Peter Z. Takacs, Brookhaven National Lab. (United States)


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