Share Email Print
cover

Optical Engineering

Reduced alignment accuracy requirement using focused Gaussian beams for free-space optical interconnection
Author(s): Hironori Sasaki; Keisuke Shinozaki; Takeshi Kamijoh
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The use of a focused Gaussian beam in the space variant micro-optical interconnection system is proposed for decreasing the alignment accuracy requirement. The relationship between both longitudinal and lateral misalignment of the light source and the power loss due to beam shift and beam spot size mismatch at the collimating lens and the photodetector are derived theoretically using ABCD matrices, and numerical simulation results are also given. A focused Gaussian microoptical system is introduced by changing the beam radius ratio on the two lenses of the one-to-one Gaussian micro-optical system from unity. It is shown that the focused Gaussian micro-optical system with a smaller beam radius on the second collimating lens than on the first one has improved misalignment tolerances compared with the one-to-one Gaussian micro-optical system.

Paper Details

Date Published: 1 August 1996
PDF: 10 pages
Opt. Eng. 35(8) doi: 10.1117/1.600799
Published in: Optical Engineering Volume 35, Issue 8
Show Author Affiliations
Hironori Sasaki, Oki Electric Industry Co., Ltd. (Japan)
Keisuke Shinozaki, Oki Electric Industry Co., Ltd. (Japan)
Takeshi Kamijoh, Oki Electric Industry Co., Ltd. (Japan)


© SPIE. Terms of Use
Back to Top