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Optical Engineering

Transient phenomena analysis using dynamic speckle patterns
Author(s): Hector Jorge Rabal; Ricardo A. Arizaga; Nelly Lucia Cap; Marcelo Trivi; Graciela Romero; Elvio Alanis
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Paper Abstract

The full width at half maximum is sometimes used to characterize the autocorrelation function of the time history of a speckle pattern. We propose to include more autocorrelation points to diminish the variability of the measurement. The width of the equivalent rectangle (WER) and the X* LOG X measurements are defined and some simulations and experimental results obtained are shown.

Paper Details

Date Published: 1 January 1996
PDF: 6 pages
Opt. Eng. 35(1) doi: 10.1117/1.600789
Published in: Optical Engineering Volume 35, Issue 1
Show Author Affiliations
Hector Jorge Rabal, Ctr. de Investigaciones Opticas (Argentina)
Ricardo A. Arizaga, Centro de Investigaciones Opticas (CIOp) (Argentina)
Nelly Lucia Cap, Univ. of La Plata (Argentina)
Marcelo Trivi, Centro de Investigaciones Opticas (CIOp) (Argentina)
Graciela Romero, Univ. Nacional de Salta (Argentina)
Elvio Alanis, Univ. Nacional de Salta (Argentina)

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