Share Email Print
cover

Optical Engineering

Projection moire deflectometry for the automatic measurement of phase objects
Author(s): Ming Wang
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A computer-based method for measuring the local refractive index gradient of phase objects using the projection moire´ technique is presented. A phase object is placed in front of the projected grating pattern. The image of the projected grating pattern deforms in accordance with the variation of the refractive index of the phase object. The moire´ fringe is generated by superimposing two images of the projected gratings pattern (the original pattern and the deformed pattern). The optical transmission characteristics of projection moire´ fringe is discussed. The moire´ deflectogram is analyzed by Fourier filtering and the phasemeasuring technique.

Paper Details

Date Published: 1 July 1996
PDF: 7 pages
Opt. Eng. 35(7) doi: 10.1117/1.600777
Published in: Optical Engineering Volume 35, Issue 7
Show Author Affiliations
Ming Wang, Jiangxi Polytechnic Univ. (Japan)


© SPIE. Terms of Use
Back to Top