Share Email Print
cover

Optical Engineering

Scanner performance from edge slope and cutoff frequencies [also Erratum 36(8)2361(Aug1997)]
Author(s): James J. Jakubowski
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The day-to-day evaluation of a scanner system’s performance, a problem in quality assurance, is addressed by deriving a technique for establishing it’s system cutoff spatial frequency through the analysis of the edge slope. It is shown that the slope value at the midpoint of the system’s imaged edge (edge response) is related (and, for some conditions, equal to) its cutoff frequency. From the analysis, a parameter emerges that describes the sampling aperture as ‘‘hard’’ or ‘‘soft,’’ signifying whether its shape is best described by geometrical or physical optics, respectively. The physical implications of this description are discussed and results are substantiated experimentally using a microdensitometer.

Paper Details

Date Published: 1 July 1996
PDF: 12 pages
Opt. Eng. 35(7) doi: 10.1117/1.600776
Published in: Optical Engineering Volume 35, Issue 7
Show Author Affiliations
James J. Jakubowski


© SPIE. Terms of Use
Back to Top