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Optical Engineering

Spatial light modulator phase depth determination from optical diffraction information
Author(s): John L. McClain; Peter S. Erbach; Don A. Gregory; Francis T. S. Yu
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Paper Abstract

A noninterferometric technique is presented for determining the phase modulating characteristics of spatial light modulators. Examining the far-field diffraction pattern intensity distribution for specific input functions enables the phase modulation to be calculated. Results are compared with usual interferometric techniques for a liquid crystal based modulator.

Paper Details

Date Published: 1 April 1996
PDF: 4 pages
Opt. Eng. 35(4) doi: 10.1117/1.600704
Published in: Optical Engineering Volume 35, Issue 4
Show Author Affiliations
John L. McClain, Univ. of Alabama in Huntsville (United States)
Peter S. Erbach, Univ. of Alabama in Huntsville (United States)
Don A. Gregory, Univ. of Alabama in Huntsville (United States)
Francis T. S. Yu, The Pennsylvania State Univ. (United States)

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