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Optical Engineering

Spatial light modulator phase depth determination from optical diffraction information
Author(s): John L. McClain; Peter S. Erbach; Don A. Gregory; Francis T. S. Yu
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Paper Details

Date Published: 1 April 1996
PDF: 4 pages
Opt. Eng. 35(4) doi: 10.1117/1.600704
Published in: Optical Engineering Volume 35, Issue 4
Show Author Affiliations
John L. McClain, Univ. of Alabama in Huntsville (United States)
Peter S. Erbach, Univ. of Alabama in Huntsville (United States)
Don A. Gregory, Univ. of Alabama in Huntsville (United States)
Francis T. S. Yu, The Pennsylvania State Univ. (United States)


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