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Optical Engineering

Dynamics of optical damage of thin aluminum film irradiated by picosecond laser pulses
Author(s): V. V. Golovlyov; W. R. Garrett; C. H. Winston Chen
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Paper Abstract

Time resolved reflectivity measurements of thin aluminum films undergoing damage by picosecond laser pulses are described. Experimental results are compared with results from reflectance calculations using the model of hydrodynamic expansion of a metal layer heated by a short laser pulse. Both experimental and theoretical results confirm that thin metal films are useful as damageable optical elements in an optical power limiting device.

Paper Details

Date Published: 1 March 1996
PDF: 5 pages
Opt. Eng. 35(3) doi: 10.1117/1.600665
Published in: Optical Engineering Volume 35, Issue 3
Show Author Affiliations
V. V. Golovlyov, Oak Ridge National Lab. (United States)
W. R. Garrett, Oak Ridge National Lab. (United States)
C. H. Winston Chen, Oak Ridge National Lab. (United States)


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