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Optical Engineering

Correlation length used as a predictor of fundamental scale lengths for image characterization
Author(s): John W. Hilgers; William R. Reynolds; James R. McManamey; David Strang
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Paper Details

Date Published: 1 March 1996
PDF: 8 pages
Opt. Eng. 35(3) doi: 10.1117/1.600648
Published in: Optical Engineering Volume 35, Issue 3
Show Author Affiliations
John W. Hilgers, Signature Research Inc. (United States)
William R. Reynolds, Signature Research, Inc. (United States)
James R. McManamey, U.S. Army RD&E Ctr. Belvoir (United States)
David Strang, Michigan Technological Univ. (United States)


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