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Optical Engineering

Equal-thickness-fringe multiple reflection interferometer for ultra-high-speed interference recording
Author(s): Jian Lu; Xiao-Wu Ni; Anzhi He
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Paper Abstract

An equal-thickness-fringe multiple reflection interferometer for ultra-high-speed multiframe recording is reported. The initial process of laser-produced plasma on a dielectric film layer is explored using this interferometer, and five interferograms with 30-ns frame intervals are obtained.

Paper Details

Date Published: 1 June 1996
PDF: 3 pages
Opt. Eng. 35(6) doi: 10.1117/1.600611
Published in: Optical Engineering Volume 35, Issue 6
Show Author Affiliations
Jian Lu, Nanjing Univ. of Science and Technology (China)
Xiao-Wu Ni, Nanjing Univ. of Science and Technology (China)
Anzhi He, Nanjing Univ. of Science and Technology (China)


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