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Journal of Electronic Imaging

From invariant line features clustering to line matching: theory and applications
Author(s): Djemaa Kachi; Xiaowei Tu
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Paper Abstract

In this paper, we formulate a complete approach of line matching, based on geometrical invariants. In the proposed technique, it is not necessary to have a priori knowledge about the observed objects and the camera calibration coefficients. This technique can be used in on-line tasks in robotics, tracking, and target recognition applications. A line segment is locally represented by invariant parameters under the group of displacements within an image and the scale changes. The matching process is achieved through two steps, features clustering and hypotheses verification. In order to be matched, a pair of lines represented by neighboring features in the parameter space must satisfy geometrical constraints (relative angle and distance) in the image plane. Conducted analysis and tests proved the stability of proposed line invariants under complex movements of camera. Experimental results have shown a high rate matching on different types of computer generated and real images.

Paper Details

Date Published: 1 April 1999
PDF: 11 pages
J. Electron. Imag. 8(2) doi: 10.1117/1.482696
Published in: Journal of Electronic Imaging Volume 8, Issue 2
Show Author Affiliations
Djemaa Kachi, Univ. de Technologie de Compiegne (France)
Xiaowei Tu, Univ. de Technologie de Compiegne (Canada)

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