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Journal of Electronic Imaging

From invariant line features clustering to line matching: theory and applications
Author(s): Djemaa Kachi; Xiaowei Tu
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Paper Details

Date Published: 1 April 1999
PDF: 11 pages
J. Electron. Imaging. 8(2) doi: 10.1117/1.482696
Published in: Journal of Electronic Imaging Volume 8, Issue 2
Show Author Affiliations
Djemaa Kachi, Univ. de Technologie de Compiegne (France)
Xiaowei Tu, Univ. de Technologie de Compiegne (Canada)

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