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Optical Engineering

Coupled plasmonic assisted progressive multiple resonance for dielectric material characterization
Author(s): Mahua Bera; Mina Ray
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Paper Abstract

In this paper, we report the theoretical analysis of different types of plasmonic structures with the main emphasis on the coupled plasmon waveguide resonance due to several advantages offered by the same compared to other structures. Multiple resonance dips are found to increase with the increase in the dielectric layer thickness and this progressive nature of the dips can be efficiently utilized to characterize the dielectric material within a composite multilayer plasmonic structure. Supporting simulation results carried out in the MATLAB environment are also provided to validate the proposed application.

Paper Details

Date Published: 1 October 2011
PDF: 9 pages
Opt. Eng. 50(10) 103801 doi: 10.1117/1.3640823
Published in: Optical Engineering Volume 50, Issue 10
Show Author Affiliations
Mahua Bera, Univ. of Calcutta (India)
Mina Ray, Univ. of Calcutta (India)

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