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Optical Engineering

New transverse techniques for characterizing high-power optical fibers
Author(s): Andrew D. Yablon
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Paper Abstract

Novel transverse techniques for measuring the refractive index profile and spontaneous emission of high-power optical fibers are described. These techniques are particularly attractive for measuring fiber samples incorporating axial variations, such as mode transformers, gratings, fusion splices, tapers, taps, or couplers. Computerized tomography of spontaneous emission is demonstrated as the first nondestructive method for estimating the spatial distribution of gain in a rare earth-doped fiber, which can be particularly useful when exploiting a spatially inhomogeneous dopant profile.

Paper Details

Date Published: 1 November 2011
PDF: 7 pages
Opt. Eng. 50(11) 111603 doi: 10.1117/1.3609812
Published in: Optical Engineering Volume 50, Issue 11
Show Author Affiliations
Andrew D. Yablon, Interfiber Analysis (United States)


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