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Journal of Electronic Imaging

Residual bulk image quantification and management for a full frame charge coupled device image sensor
Author(s): Richard D. Crisp
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Paper Abstract

Residual bulk image (RBI) is significant in the KAF09000 CCD. Residual images are observed 2 h after illumination at −20C. Trap leakage and capacity are studied as a function of temperature. A flood-flush protocol is evaluated for eliminating RBI artifacts. A substrate trap fixed pattern noise is observed and is removed by dark-subtraction. An increase of dark current shot noise due to trap leakage will occur but can be minimized by deep cooling. Operating temperature targets are set as a function of target noise levels. An operating temperature of -87C for a 30 min exposure is projected to support a read noise constraint of 5 e-.

Paper Details

Date Published: 1 July 2011
PDF: 5 pages
J. Electron. Imag. 20(3) 033006 doi: 10.1117/1.3604004
Published in: Journal of Electronic Imaging Volume 20, Issue 3
Show Author Affiliations
Richard D. Crisp, Invensas, Inc. (United States)


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