Share Email Print

Journal of Electronic Imaging

Residual bulk image quantification and management for a full frame charge coupled device image sensor
Author(s): Richard D. Crisp
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Residual bulk image (RBI) is significant in the KAF09000 CCD. Residual images are observed 2 h after illumination at −20C. Trap leakage and capacity are studied as a function of temperature. A flood-flush protocol is evaluated for eliminating RBI artifacts. A substrate trap fixed pattern noise is observed and is removed by dark-subtraction. An increase of dark current shot noise due to trap leakage will occur but can be minimized by deep cooling. Operating temperature targets are set as a function of target noise levels. An operating temperature of -87C for a 30 min exposure is projected to support a read noise constraint of 5 e-.

Paper Details

Date Published: 1 July 2011
PDF: 5 pages
J. Electron. Imag. 20(3) 033006 doi: 10.1117/1.3604004
Published in: Journal of Electronic Imaging Volume 20, Issue 3
Show Author Affiliations
Richard D. Crisp, Invensas, Inc. (United States)

© SPIE. Terms of Use
Back to Top