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Journal of Nanophotonics

Spectroscopic ellipsometry of few-layer graphene
Author(s): Goran Isic; Milka Jakovljevic; Marko Filipovic; Djordje M. Jovanovic; Borislav Vasic; Sasa Lazovic; Nevena Puac; Zoran Lj. Petrovic; Radmila Kostic; Rados Gajic; Josef Humlicek; Maria Losurdo; Giovanni Bruno; Iris Bergmair; Kurt Hingerl
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Paper Abstract

The optical properties of few-layer graphene (FLG) films were measured in the ultraviolet and visible spectrum using a spectroscopic ellipsometer equipped with a 50-μm nominal microspot size. The FLG thickness was found by atomic force microscopy. Measurements revealed that the microspot is larger than the FLG flake. The ellipsometric data was interpreted using the island-film model. Comparison with graphite and recently published graphene data showed reasonable agreement, but with some features that could not be explained. The error margin for the optical constants was estimated to be ±10%.

Paper Details

Date Published: 1 January 2011
PDF: 8 pages
J. Nanophoton. 5(1) 051809 doi: 10.1117/1.3598162
Published in: Journal of Nanophotonics Volume 5, Issue 1
Show Author Affiliations
Goran Isic, Univ. of Leeds (United Kingdom)
Milka Jakovljevic, Univ. of Belgrade (Serbia)
Marko Filipovic, Univ. of Belgrade (Serbia)
Djordje M. Jovanovic, Institute of Physics (Serbia)
Borislav Vasic, Institute of Physics (Serbia)
Sasa Lazovic, Univ. of Belgrade (Serbia)
Nevena Puac, Univ. of Belgrade (Serbia)
Zoran Lj. Petrovic, Institute of Physics (Serbia)
Radmila Kostic, Univ. of Belgrade (Serbia)
Rados Gajic, Institute of Physics (Serbia)
Josef Humlicek, Masaryk Univ. (Czech Republic)
Maria Losurdo, Univ. degli Studi di Bari (Italy)
Giovanni Bruno, Univ. degli Studi di Bari (Italy)
Iris Bergmair, PROFACTOR GmbH (Austria)
Kurt Hingerl, Johannes Kepler Univ. Linz (Austria)

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