Share Email Print

Optical Engineering

Precision measurement system using binary phase computer-generated holograms
Author(s): Edward Buckley; Adrian J. Cable; Timothy D. Wilkinson
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

We present a novel method of obtaining precision measurement using two binary phase diffractive optical elements, termed the hologram, and phase mask. By encoding multiple views into the hologram, each of which corresponds to a horizontal or vertical relative displacement of the phase mask, the system is able to provide a visual feedback of the measurement without the use of electronics. A probabilistic method for detection of the resultant images, matched to the statistical properties of holographic replay, shows promise for enabling a fully automated measurement system.

Paper Details

Date Published: 1 September 2011
PDF: 9 pages
Opt. Eng. 50(9) 091308 doi: 10.1117/1.3596201
Published in: Optical Engineering Volume 50, Issue 9
Show Author Affiliations
Edward Buckley, Pixtronix, Inc. (United States)
Adrian J. Cable, Light Blue Optics Ltd. (United Kingdom)
Timothy D. Wilkinson, Univ. of Cambridge (United Kingdom)

© SPIE. Terms of Use
Back to Top