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Optical Engineering

New image quality assessment method using wavelet leader pyramids
Author(s): Xiaolin Chen; Xiaokang Yang; Shibao Zheng; Weiyao Lin; Rui Zhang; Guangtao Zhai
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Paper Abstract

In this paper, we propose a wave leader pyramids based Visual Information Fidelity method for image quality assessment. Motivated by the observations that the human vision systems (HVS) are more sensitive to edge and contour regions and that the human visual sensitivity varies with spatial frequency, we first introduce the two-dimensional wavelet leader pyramids to robustly extract the multiscale information of edges. Based on the wavelet leader pyramids, we further propose a visual information fidelity metric to evaluate the quality of images by quantifying the information loss between the original and the distorted images. Experimental results show that our method outperforms many state-of-the-art image quality metrics.

Paper Details

Date Published: 1 June 2011
PDF: 9 pages
Opt. Eng. 50(6) 067011 doi: 10.1117/1.3591949
Published in: Optical Engineering Volume 50, Issue 6
Show Author Affiliations
Xiaolin Chen, Shanghai Jiao Tong Univ. (China)
Xiaokang Yang, Shanghai Jiao Tong Univ. (China)
Shibao Zheng, Shanghai Jiao Tong Univ. (China)
Weiyao Lin, Shanghai Jiao Tong Univ. (China)
Rui Zhang, Shanghai Jiao Tong Univ. (China)
Guangtao Zhai, Shanghai Jiao Tong Univ. (China)


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