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Optical Engineering

Short-wavelength infrared imaging using low dark current InGaAs detector arrays and vertical-cavity surface-emitting laser illuminators
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Paper Abstract

We describe the factors that go into the component choices for a short wavelength IR (SWIR) imager, which include the SWIR sensor, the lens, and the illuminator. We have shown the factors for reducing dark current, and shown that we can achieve well below 1.5 nA/cm2 for 15 μm devices at 7 °C. In addition, we have mated our InGaAs detector arrays to 640×512 readout integrated integrated circuits to make focal plane arrays (FPAs). The resulting FPAs are capable of imaging photon fluxes with wavelengths between 1 and 1.6 μm at low light levels. The dark current associated with these FPAs is extremely low, exhibiting a mean dark current density of 0.26 nA/cm2 at 0 °C. Noise due to the readout can be reduced from 95 to 57 electrons by using off-chip correlated double sampling. In addition, Aerius has developed laser arrays that provide flat illumination in scenes that are normally light-starved. The illuminators have 40% wall-plug efficiency and provide low-speckle illumination, and provide artifact-free imagery versus conventional laser illuminators.

Paper Details

Date Published: 1 June 2011
PDF: 8 pages
Opt. Eng. 50(6) 061011 doi: 10.1117/1.3579520
Published in: Optical Engineering Volume 50, Issue 6
Show Author Affiliations
Michael H. MacDougal, Aerius Photonics, LLC (United States)
Jonathan C. Geske, Aerius Photonics, LLC (United States)
Chad Wang, Aerius Photonics, LLC (United States)
David Follman, Aerius Photonics, LLC (United States)

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