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Optical Engineering

Optical three-dimensional metrology with structured illumination
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Paper Abstract

A variety of techniques have been developed to measure the three-dimensional shape of an object using structured illumination. The measurement of objects with diffusely reflecting surfaces by means of projected patterns can be considered a standard technique. Also more recently, methods for the measurement of specularly reflecting or transparent surfaces by evaluation of the images of regular patterns have been published. In this paper, we suggest a systematic treatment of all of these methods as generalized active or passive triangulation techniques.

Paper Details

Date Published: 1 October 2011
PDF: 11 pages
Opt. Eng. 50(10) 101507 doi: 10.1117/1.3578448
Published in: Optical Engineering Volume 50, Issue 10
Show Author Affiliations
Rainer Tutsch, Technische Univ. Braunschweig (Germany)
Marcus Petz, Technische Univ. Braunschweig (Germany)
Marc Fischer, Technische Univ. Braunschweig (Germany)

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