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Optical Engineering

Quantifying wavefront measurement variation with standard deviation maps
Author(s): Brian T. Hart
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Paper Abstract

A choice of methods exists for determining the variability of an averaged wavefront measurement. Pixel-by-pixel standard deviation (SD) maps provide a spatial description of the variability as well as a scalar magnitude. An efficient algorithm for computing SD maps as measurements occur is given. Results for simulated and experimental wave-front maps are shown. Plots of the average SD as a measurement progresses can be used to characterize a test system and determine the minimum number of measurements required for acceptable results.

Paper Details

Date Published: 1 May 2011
PDF: 7 pages
Opt. Eng. 50(5) 053607 doi: 10.1117/1.3577702
Published in: Optical Engineering Volume 50, Issue 5
Show Author Affiliations
Brian T. Hart, ITT Corp. (United States)

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