Share Email Print

Optical Engineering

Phase unwrapping method based on reliability and digital point array
Author(s): Lei Song; Huimin Yue; Yong Liu; Yongzhi Liu
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

Phase unwrapping, which usually involves complicated and time-consuming procedures, is crucial for phase-measuring profilometry. Unwrapping isolated phase regions with global phase discontinuity is challenging for traditional reliability ordering based phase unwrapping methods. This paper presents a novel method that combines the advantages of digital point array based active triangulation profilometry with a reliability of modulation ordering algorithm. Table entries that store spatial coordinates of sampling points are established, and the true phases measured by geometrical relationships are used to direct phase unwrapping. Different from the proposed 2D spatial unwrapping algorithms until now, the fringe order can be easily identified by referencing the patterns of multiple points. Additionally, unwrapping from the interior part of isolated regions following an optimized path is guaranteed. The prevention of penetration through invalid pixels into isolated regions ensures this new method will alleviate errors due to phase ambiguity. Simulation and experimental results demonstrate that the proposed technique can feasibly measure objects with a wide range of height variation.

Paper Details

Date Published: 1 April 2011
PDF: 9 pages
Opt. Eng. 50(4) 043605 doi: 10.1117/1.3562324
Published in: Optical Engineering Volume 50, Issue 4
Show Author Affiliations
Lei Song, Univ. of Electronic Science and Technology of China (China)
Huimin Yue, Univ. of Electronic Science and Technology of China (China)
Yong Liu, Univ. of Electronic Science and Technology of China (China)
Yongzhi Liu, Univ. of Electronic Science and Technology of China (China)

© SPIE. Terms of Use
Back to Top