Share Email Print

Journal of Photonics for Energy • Open Access

The effect of p-type doping on the performance of organic thin-film photovoltaic devices- m-MTDATA/C60 and 2-TNATA/C60 systems
Author(s): Takao Umeda; Keigo Chujyou; Yasuhiro Nomura; Kotarou Tsuchida; Michihiro Hara; Sayo Terashima; Yasuhiro Koji; Hiroshi Kageyama; Yasuhiko Shirota

Paper Abstract

The effect of p-type doping of the donor layer with 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F4TCNQ) on the performance of planar pn-heterojunction organic photovoltaic devices using 4,4′,4″-tris[3-methylphenyl(phenyl)amino]triphenylamine (m-MTDATA) or 4,4′,4″-tris[2-naphthyl(phenyl)amino]triphenylamine (2-TNATA) as an electron donor and C60 as an electron acceptor was studied. It was found that doping of the donor layer with F4TCNQ increases both the short-circuit photocurrent and the fill factor by 1.7 to 2.0 times and 1.5 to 1.6 times, respectively, but reduces the open-circuit voltage, resulting in the enhancement of power conversion efficiency by 1.6 to 1.7 times. These features caused by the doping are attributed to the decrease in the bulk resistance of the electron donor layer as a result of the p-type doping. The decrease in the open-circuit voltage was partly compensated by incorporation of a thin layer of undoped m-MTDATA on the ITO electrode, and hence, the power conversion efficiency was further enhanced.

Paper Details

Date Published: 1 January 2011
PDF: 12 pages
J. Photon. Energy 1(1) 011113 doi: 10.1117/1.3556725
Published in: Journal of Photonics for Energy Volume 1, Issue 1
Show Author Affiliations
Takao Umeda, Fukui Univ. of Technology (Japan)
Keigo Chujyou, Fukui Univ. of Technology (Japan)
Yasuhiro Nomura, Fukui Univ. of Technology (Japan)
Kotarou Tsuchida, Fukui Univ. of Technology (Japan)
Michihiro Hara, Fukui Univ. of Technology (Japan)
Sayo Terashima, Kansai Electric Power Co., Ltd. (Japan)
Yasuhiro Koji, Kansai Electric Power Co., Ltd. (Japan)
Hiroshi Kageyama, Osaka Univ. (Japan)
Yasuhiko Shirota, Fukui Univ. of Technology (Japan)

© SPIE. Terms of Use
Back to Top