Share Email Print

Optical Engineering

Measurement of the third-order optical nonlinear properties of a metal/porous silicon composite system
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We report the measurements of the nonlinear refractive index of a metal/porous silicon composite system as measured by the reflection Z-scan technique. The composite system is formed by using magnetron sputtering to deposit thin metallic films onto porous silicon anodized on p-type silicon. The experiment results indicate an enhancement over the nonlinear refractive index of the composite system, which suggests an opportunity to form new-type nonlinear-optical media consisting of porous silicon for nonlinear optical applications such as power limiting or optical switching.

Paper Details

Date Published: 1 March 2011
PDF: 6 pages
Opt. Eng. 50(3) 033604 doi: 10.1117/1.3554382
Published in: Optical Engineering Volume 50, Issue 3
Show Author Affiliations
Mei Xiang, Xinjiang Univ. (China)
Zhenhong Jia, Xinjiang Univ. (China)
Xiaoyi Lv, Xi'an Jiaotong Univ. (China)
Furu Zhong, Xinjiang Univ. (China)

© SPIE. Terms of Use
Back to Top