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Optical Engineering

Measurement of the third-order optical nonlinear properties of a metal/porous silicon composite system
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Paper Abstract

We report the measurements of the nonlinear refractive index of a metal/porous silicon composite system as measured by the reflection Z-scan technique. The composite system is formed by using magnetron sputtering to deposit thin metallic films onto porous silicon anodized on p-type silicon. The experiment results indicate an enhancement over the nonlinear refractive index of the composite system, which suggests an opportunity to form new-type nonlinear-optical media consisting of porous silicon for nonlinear optical applications such as power limiting or optical switching.

Paper Details

Date Published: 1 March 2011
PDF: 6 pages
Opt. Eng. 50(3) 033604 doi: 10.1117/1.3554382
Published in: Optical Engineering Volume 50, Issue 3
Show Author Affiliations
Mei Xiang, Xinjiang Univ. (China)
Zhenhong Jia, Xinjiang Univ. (China)
Xiaoyi Lv, Xi'an Jiaotong Univ. (China)
Furu Zhong, Xinjiang Univ. (China)

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