Share Email Print

Optical Engineering

Twin-image elimination using quadrantal masks in a digital holographic microscope
Author(s): Moonseok Kim; Sukjoon Hong; Seongbo Shim; Kwangsup Soh; Younghun Yu; Sanghoon Shin; Jaewan Kim; Jaisoon Kim
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Holography has a considerable advantage of retrieving three-dimensional information of an object from only one interference recording. However, twin images always appear in the reconstruction for the reason of symmetry. Especially, twin images significantly deteriorate the quality of the reconstructed information in on-axis configuration. A solution of the twin-image problem in a digital holographic microscope by using symmetry with quadrantal masks is suggested in this study. This method is effective to most of the measured area without any additional implements, and restrictions on sample or iterations, and is demonstrated by the simulation and experimental results. The ratio of the disturbed area by a twin-image to the total measured area is reduced to the value of 0.82% in a specific case.

Paper Details

Date Published: 1 February 2011
PDF: 6 pages
Opt. Eng. 50(2) 025801 doi: 10.1117/1.3537970
Published in: Optical Engineering Volume 50, Issue 2
Show Author Affiliations
Moonseok Kim, Seoul National Univ. (Korea, Republic of)
Sukjoon Hong, Seoul National Univ. (Korea, Republic of)
Seongbo Shim, Seoul National Univ. (Korea, Republic of)
Kwangsup Soh, Seoul National Univ. (Korea, Republic of)
Younghun Yu, Cheju National Univ. (Korea, Republic of)
Sanghoon Shin, Alpha of Professional Person & Technology, Inc. (Korea, Republic of)
Jaewan Kim, Myongji Univ. (Korea, Republic of)
Jaisoon Kim, Myongji Univ. (Korea, Republic of)

© SPIE. Terms of Use
Back to Top