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Journal of Nanophotonics • Open Access

Near-field intensity correlations on nanoscaled random silver/dielectric films
Author(s): Julien Laverdant; Stephanie Buil; Jean-Pierre Hermier; Xavier Quelin

Paper Abstract

Near-field intensity distributions in inhomogeneous silver nanostructures were investigated using near-field optical microscopy. By varying the metallic concentration and the excitation wavelength, different plasmon scattering regimes were addressed and identified using statistical analysis tools such as the probability density function and intensity auto-correlation function. The intensity correlation length was found to indicate an intermediate regime where both surface scattering and plasmon localization coexist on the same scale.

Paper Details

Date Published: 1 October 2010
PDF: 7 pages
J. Nanophoton. 4(1) 049505 doi: 10.1117/1.3506519
Published in: Journal of Nanophotonics Volume 4, Issue 1
Show Author Affiliations
Julien Laverdant, Univ. Pierre et Marie Curie (France)
Stephanie Buil, Univ. de Versailles Saint-Quentin-en Yvelines (France)
Jean-Pierre Hermier, Univ. de Versailles Saint-Quentin-en Yvelines (France)
Xavier Quelin, Univ. de Versailles Saint-Quentin-en Yvelines (France)


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