Reliability of 4.6-µm quantum cascade lasers under continuous-wave room-temperature operation | (2010) | Xie | Publications

Optical Engineering

Reliability of 4.6-µm quantum cascade lasers under continuous-wave room-temperature operation

Author(s): Feng Xie; Catherine G. Caneau; Herve P. LeBlanc; Christopher A. Page; Satish C. Chaparala; Oberon D. Deichmann; Lawrence C. Hughes; Chung-En Zah

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Paper Abstract

We report the life test results for 9 4.6-µm planar buried heterostructure quantum cascade lasers made of strain-balanced GaInAs/AlInAs/InP materials grown by metal organic vapor-phase epitaxy. No facet coating was deposited, and the devices were mounted on CuW submounts using AuSn solder. The aging condition is continuous wave operation at a heat-sink temperature of 22ºC with a constant current of 0.85A, corresponding to current densities of 4.7 and 2.7 kA/cm2, for lasers with widths of 4 and 7 µm, respectively. All lasers survived 5000 h aging, and most devices showed improved performance during the first 1000 h of aging.

Paper Details

Date Published: 1 November 2010
PDF: 5 pages
Opt. Eng. 49(11) 111104 doi: 10.1117/1.3498776
Published in: Optical Engineering Volume 49, Issue 11

Show Author Affiliations

Feng Xie, Corning Incorporated (United States)
Catherine G. Caneau, Corning Incorporated (United States)
Herve P. LeBlanc, Corning Incorporated (United States)
Christopher A. Page, Corning Incorporated (United States)

Satish C. Chaparala, Corning Incorporated (United States)
Oberon D. Deichmann, Corning Incorporated (United States)
Lawrence C. Hughes, Corning Incorporated (United States)
Chung-En Zah, Corning Incorporated (United States)