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Journal of Electronic Imaging • Open Access

Special Section Guest Editorial: Quality Control for Artificial Vision

Paper Abstract

This PDF file contains the editorial “Special Section Guest Editorial: Quality Control for Artificial Vision” for JEI Vol. 19 Issue 3

Paper Details

Date Published: 1 July 2010
PDF: 1 pages
J. Electron. Imaging. 19(3) 031201 doi: 10.1117/1.3497000
Published in: Journal of Electronic Imaging Volume 19, Issue 3
Show Author Affiliations
Edmund Y. Lam, The Univ. of Hong Kong (Hong Kong, China)
Shaun Scott Gleason, Oak Ridge National Lab. (United States)
Kurt S. Niel, Fachhochschule Wels (Austria)


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