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Journal of Nanophotonics

Estimation of polyethylene nanothin layer morphology by differential evanescent light intensity imaging
Author(s): Nina Mirchin; Michael Gankin; Uri Gorodetsky; Simona A. Popescu; Igor Lapsker; Aaron Peled; Liviu Duta; Gabriela Dorcioman; Andrei Popescu; Ion N. Mihailescu
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Paper Abstract

We investigated the morphology of polyethylene films by the Differential Evanescent Light Intensity (DELI) imaging method developed by us previously. The films were prepared by the Matrix Assisted Pulsed Laser Evaporation (MAPLE) technique. Rough or smooth organic layers were fabricated with thickness depending on the deposition conditions. We used the DELI imaging method here as a fast, low cost method for surface morphology diagnostics of large areas (i.e., hundreds of mm2) of nano layer polyethylene films.

Paper Details

Date Published: 1 July 2010
PDF: 13 pages
J. Nanophoton. 4(1) 041760 doi: 10.1117/1.3477983
Published in: Journal of Nanophotonics Volume 4, Issue 1
Show Author Affiliations
Nina Mirchin, Holon Institute of Technology (Israel)
Michael Gankin, Holon Institute of Technology (Israel)
Uri Gorodetsky, Holon Institute of Technology (Israel)
Simona A. Popescu, Holon Institute of Technology (Israel)
Igor Lapsker, Holon Institute of Technology (Israel)
Aaron Peled, Holon Institute of Technology (Israel)
Liviu Duta, National Institute for Lasers, Plasma and Radiation Physics (Romania)
Gabriela Dorcioman, National Institute for Lasers, Plasma and Radiation Physics (Romania)
Andrei Popescu, National Institute for Lasers, Plasma and Radiation Physics (Romania)
Ion N. Mihailescu, National Institute for Lasers, Plasma and Radiation Physics (Romania)


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