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Journal of Electronic Imaging

Novel image analysis method for in situ monitoring the particle size distribution of batch crystallization processes
Author(s): Benoit Presles; Johan Debayle; Gilles Fevotte; Jean-Charles Pinoli
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Paper Abstract

This article presents a new in situ method to monitor the particle size distribution (PSD) during batch solution crystallization processes. Using a new in situ imaging probe, the "EZProbe sensor," real time acquisition of 2-D images of particles during the batch process is now possible. To analyze these images, a novel image analysis method is carried out. First, segmentation and restoration algorithms are performed to identify the particles and thereafter geometrical particle measurements are achieved to obtained the PSD of the batch crystallization process over time. Satisfactory measurements are obtained provided that the overall solid concentration does not exceed a threshold above which too many overlapping crystals make discrimination between particles impossible.

Paper Details

Date Published: 1 July 2010
PDF: 7 pages
J. Electron. Imag. 19(3) 031207 doi: 10.1117/1.3462800
Published in: Journal of Electronic Imaging Volume 19, Issue 3
Show Author Affiliations
Benoit Presles, École Nationale Supérieure des Mines de Saint-Étienne (France)
Johan Debayle, École Nationale Supérieure des Mines de Saint-Étienne (France)
Gilles Fevotte, École Nationale Supérieure des Mines de Saint-Étienne (France)
Jean-Charles Pinoli, École Nationale Supérieure des Mines de Saint-Étienne (France)


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