Share Email Print

Optical Engineering

Extension of the upper measuring limit in out-of plane deformation measurement by combination of digital holography and desensitized electronic speckle pattern interferometry
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Digital holography and electronic speckle pattern interferometry are promising tools for industrial applications for deformation and shape measurements. Because of the limited measuring range, compensation methods can be applied in practical measurements. They can be digital, because these measuring techniques operate with images recorded with digital camera. We develop a new measurement setup, combining two out-of-plane displacement measurements with different sensitivities and an adaptive compensation method. Using this compensation method much more precise displacement maps can be produced than would be possible from a single measurement. One major task is to perform automatic measurements even if the deformation is higher than the upper measuring range of the basic method.

Paper Details

Date Published: 1 June 2010
PDF: 7 pages
Opt. Eng. 49(6) 065801 doi: 10.1117/1.3456696
Published in: Optical Engineering Volume 49, Issue 6
Show Author Affiliations
Richard Séfel, Budapest Univ. of Technology and Economics (Hungary)
János Kornis, Budapest Univ. of Technology and Economics (Hungary)

© SPIE. Terms of Use
Back to Top