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Journal of Electronic Imaging • Open Access

Special Section Guest Editorial: Image Quality Assessment

Paper Abstract

This PDF file contains the editorial “Special Section Guest Editorial: Image Quality Assessment” for JEI Vol. 19 Issue 01

Paper Details

Date Published: 1 January 2010
PDF: 1 pages
J. Electron. Imag. 19(1) 011001 doi: 10.1117/1.3378538
Published in: Journal of Electronic Imaging Volume 19, Issue 1
Show Author Affiliations
Susan P. Farnand, Rochester Institute of Technology (United States)
Frans Gaykema, Océ Technologies B.V. (Netherlands)

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