Share Email Print

Journal of Micro/Nanolithography, MEMS, and MOEMS

Parameters affecting electrospray performance of hot-embossed open-channel polymer microfluidic chips
Author(s): Sana Malahat; Pio G. Iovenitti; Igor Sbarski
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We investigate the effect of chip tip-to-counter electrode spacing (gap), channel-size aspect ratio, onset voltage on electrospray ionization (ESI) performance of embossed polymer microfluidic chips. Planar polymer substrates were hot embossed using an electroformed tool and a laser machined tool. The embossed microchips were tested for successful ESI demonstration with minimum sample consumption and high throughput. Factors influencing the stability of electrospray were analyzed by a series of experiments. Theoretically and experimentally, it was observed that the distance of the microchannel tip to the counter electrode directly relates to the onset voltage applied. Furthermore, the overall pattern observed is the decrease in Taylor cone size with a decrease in channel dimensions. The total ion current was analyzed as a function of time and onset voltage at various gaps. Five electrospray modes, namely, drop mode, pulse mode, Taylor-cone jet mode, multijet mode, and oscillating jet mode recorded at the open channel tips were identified and the electrospray cycle investigated. These results are in good accordance with theory, and comparisons are drawn with the findings of other researchers.

Paper Details

Date Published: 1 January 2010
PDF: 11 pages
J. Micro/Nanolith. MEMS MOEMS 9(1) 013050 doi: 10.1117/1.3309710
Published in: Journal of Micro/Nanolithography, MEMS, and MOEMS Volume 9, Issue 1
Show Author Affiliations
Sana Malahat, Swinburne Univ. of Technology (Australia)
Pio G. Iovenitti, Swinburne Univ. of Technology (Australia)
Igor Sbarski, Swinburne Univ. of Technology (Australia)

© SPIE. Terms of Use
Back to Top