Share Email Print
cover

Journal of Biomedical Optics

Multidistance probe arrangement to eliminate artifacts in functional near-infrared spectroscopy
Author(s): Toru Yamada; Shinji Umeyama; Keiji Matsuda
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Functional near-infrared spectroscopy has the potential to easily detect cerebral functional hemodynamics. However, in practical fNIRS measurements, a subject's physical or systemic physiological activities often cause undesirable artifacts. Such activities can be evoked even by task execution. In this case, observed artifacts may correlate strongly with the task sequence, and it is difficult to eliminate them by conventional signal filtering techniques. We present a theoretical analysis and Monte Carlo simulations of layered media in which both scattering and absorption changes occur, and show that a multidistance probe arrangement is effective in removing artifacts and extracting functional hemodynamics. The probe arrangement is determined based on simulation results. Artifacts induced by nonfunctional tasks (body tilting, head nodding, and breath holding) are clearly observed when a conventional method is used; such artifacts are appreciably reduced by the proposed method. Signals evoked by single-sided finger movements are observed at both hemispheres when we use a conventional method. On the other hand, localized signals at the primary motor area are observed by the proposed method. A statistically significant increase in oxygenated hemoglobin and decrease in deoxygenated hemoglobin are simultaneously observed at the contralateral primary motor area

Paper Details

Date Published: 1 November 2009
PDF: 12 pages
J. Biomed. Opt. 14(6) 064034 doi: 10.1117/1.3275469
Published in: Journal of Biomedical Optics Volume 14, Issue 6
Show Author Affiliations
Toru Yamada, National Institute of Advanced Industrial Science and Technology (Japan)
Shinji Umeyama, National Institute of Advanced Industrial Science and Technology (Japan)
Keiji Matsuda, National Institute of Advanced Industrial Science and Technology (Japan)


© SPIE. Terms of Use
Back to Top