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Optical Engineering

Defect detection in aluminum foil by input-estimate-based chi-square detector
Author(s): Ming Zhai; Zhongliang Jing; Shan Fu; Xinbin Luo
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Paper Abstract

Quality inspection of aluminum foil products plays an important role for aluminum foil manufactures. We present a method that uses input estimate (IE)-based chi-square detectors for defect detection in aluminum foil. It is assumed that the intensity of the aluminum foil image is Gaussian distributed, and the distribution of the defect intensity is different from the normal. Under these assumptions, Kalman filters with a constant velocity (CV) model are used to filter the image. We assume there is an unknown input in the CV model and the unknown input is estimated in the filtering process. The defects are determined by the chi-square test of the estimate of the unknown input. Experiments show that our technique is effective for most defects in aluminum foil.

Paper Details

Date Published: 1 November 2009
PDF: 5 pages
Opt. Eng. 48(11) 119701 doi: 10.1117/1.3258433
Published in: Optical Engineering Volume 48, Issue 11
Show Author Affiliations
Ming Zhai, Shanghai Jiao Tong Univ. (China)
Zhongliang Jing, Shanghai Jiao Tong Univ. (China)
Shan Fu, Shanghai Jiao Tong Univ. (China)
Xinbin Luo, Shanghai Jiao Tong Univ. (China)


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