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Optical Engineering

Defect detection in aluminum foil by input-estimate-based chi-square detector
Author(s): Ming Zhai; Zhongliang Jing; Shan Fu; Xinbin Luo
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Paper Details

Date Published: 1 November 2009
PDF: 5 pages
Opt. Eng. 48(11) 119701 doi: 10.1117/1.3258433
Published in: Optical Engineering Volume 48, Issue 11
Show Author Affiliations
Ming Zhai, Shanghai Jiao Tong Univ. (China)
Zhongliang Jing, Shanghai Jiao Tong Univ. (China)
Shan Fu, Shanghai Jiao Tong Univ. (China)
Xinbin Luo, Shanghai Jiao Tong Univ. (China)


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