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Journal of Electronic Imaging

Fingerprint matching using local alignment based on multiple pairs of reference minutiae
Author(s): Guo Cao; Yuan Mei; Zhihong Mao; Quan-sen Sun
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Paper Abstract

A novel minutiae-based method is proposed to match deformed fingerprints. We combine minutiae structures and descriptors to obtain multiple pairs of reference minutiae and globally align two sets of minutiae to get a common overlapping region based on these pairs of reference minutiae. At the matching stage, our proposed approach aligns local areas in two fingerprints with new reference minutiae pairs that are selected from matched minutiae pairs. After registration of the fingerprints according to the local correspondence, the number of matched minutiae can be counted using tight thresholds. Experimental results confirm that the proposed algorithm is effective for fingerprint matching with nonlinear distortions.

Paper Details

Date Published: 1 October 2009
PDF: 7 pages
J. Electron. Imag. 18(4) 043002 doi: 10.1117/1.3247859
Published in: Journal of Electronic Imaging Volume 18, Issue 4
Show Author Affiliations
Guo Cao, Nanjing Univ. of Science & Technology (China)
Yuan Mei, Nanjing Univ. of Science & Technology (China)
Zhihong Mao, Sun Yat-Sen Univ. (China)
Quan-sen Sun, Nanjing Univ. of Science & Technology (China)

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