Share Email Print
cover

Optical Engineering

Image quality assessment using contourlet transform
Author(s): Mingna Liu; Xin Yang
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present a novel objective full-reference image quality assessment metric based on multiscale geometric analysis. The multichannel behavior of the human vision system is emulated by contourlet transform, a perceptual subband decomposition. Not only the contrast-masking effect but also the entropy-masking effect is considered to deal with the visual masking issue. In the error pooling stage, the frequency sensitivity of the HVS is investigated. Nonlinear and linear fusion schemes of subband distortion are compared. Extensive validation experiments are performed on two professional image databases, the LIVE database supplied by the University of Texas and the A57 database supplied by Cornell University. Compared with several state-of-the-art image quality metrics, the proposed metric demonstrates improvement on prediction accuracy and robustness.

Paper Details

Date Published: 1 October 2009
PDF: 0 pages
Opt. Eng. 48(10) 107201 doi: 10.1117/1.3241996
Published in: Optical Engineering Volume 48, Issue 10
Show Author Affiliations
Mingna Liu, Shanghai Jiao Tong Univ. (China)
Xin Yang, Shanghai Jiao Tong Univ. (China)


© SPIE. Terms of Use
Back to Top