Share Email Print

Optical Engineering

Blind deconvolution of x-ray diffraction profiles by using high-order statistics
Author(s): Jinghe Yuan
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A high-order statistical-based, blind deconvolution algorithm is proposed for x-ray powder diffraction profiles. Maximizing the kurtosis amplitude of the deconvolved data ensures that only the data with maximized kurtosis amplitude is extracted. The ill-posed nature of deconvolution is, thus, bypassed. Using simulation and experiments, this method is seen to be very robust with respect to noise. The profile resolution is enhanced considerably, and the deconvolved profile fits the pseudo-Voigt profile nicely. However, noise is enhanced in the deconvolved data, so the algorithm may be invalid for experimental data with low signal-to-noise.

Paper Details

Date Published: 1 July 2009
PDF: 5 pages
Opt. Eng. 48(7) 076501 doi: 10.1117/1.3159868
Published in: Optical Engineering Volume 48, Issue 7
Show Author Affiliations
Jinghe Yuan, Yantai Univ. (China)

© SPIE. Terms of Use
Back to Top