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Optical Engineering

Single field deinterlacing scheme using edge-direction vectors in interlaced sequences
Author(s): Gwanggil Jeon; Rafael Falcon; Luigi Gallo; Jechang Jeong; Il-Hong Suh
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Paper Abstract

In this paper, a new intrafield deinterlacing algorithm with an edge-direction vector (EDV) in the image block is introduced. The EDV, which is computed by a Sobel mask utilized edge map, was first introduced so that finer resolution of the edge direction could be acquired. The Sobel operator is performed on the "top and bottom" or "left and right" adjacent pixels to detect the most likely edge direction of the missing pixel. The proposed EDV-oriented deinterlacing system operates by identifying small pixel variations at five orientations, 26.5, 45, 90, 135, and 153.5 deg. The EDV values work as inputs of the S-type small membership function, and the weight values were obtained for each edge direction. Based on the fuzzy rule and edge-direction confidence parameter, the missing pixels were computed. These weight values were multiplied by the candidate deinterlaced pixels to successively build approximations of the deinterlaced sequence. The results of computer simulations demonstrated that the proposed method outperforms a number of previously documented intrafield deinterlacing methods.

Paper Details

Date Published: 1 June 2009
PDF: 10 pages
Opt. Eng. 48(6) 067001 doi: 10.1117/1.3146811
Published in: Optical Engineering Volume 48, Issue 6
Show Author Affiliations
Gwanggil Jeon, Hanyang Univ. (Korea, Republic of)
Rafael Falcon, Univ. of Ottawa (Canada)
Luigi Gallo
Jechang Jeong, Hanyang Univ. (Korea, Republic of)
Il-Hong Suh, Hanyang Univ. (Korea, Republic of)

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