Share Email Print

Journal of Applied Remote Sensing

Accuracy of atmospheric trends inferred from the Halogen Occultation Experiment data
Author(s): Larry L. Gordley; Robert Earl Thompson; Martin J. McHugh; Ellis E. Remsberg; James M. Russell; Brian E. Magill
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

The Halogen Occultation Experiment (HALOE) operated in orbit for over 14 years, providing high quality measurements from the upper troposphere into the lower thermosphere. Since the quality of this data set depended on the long-term stability of the instrument, a series of analysis tests were designed to routinely monitor instrument performance. These tests evaluated possible changes in the gas cells, electronic gains, optical performance, and signal temperature dependencies. The gas cell stability was determined from an analysis of the Doppler shift signature in retrieved mixing ratios. Electronic gain stability was determined by instrument scans of the solar disk, each with different balance settings. Optical and tracking performance was also determined from solar scan data. The only statistically significant changes detected were: 1. a small methane gas cell change, causing less than 0.5% per decade change in retrieved methane, and 2. a small optical alignment change in the HF channel that only affects HF results below 25 kilometers. These detailed analyses indicate that the HALOE instrument remained stable throughout the mission, adding confidence to the long-term atmospheric trends deduced from HALOE products.

Paper Details

Date Published: 1 April 2009
PDF: 24 pages
J. Appl. Rem. Sens. 3(1) 033526 doi: 10.1117/1.3131722
Published in: Journal of Applied Remote Sensing Volume 3, Issue 1
Show Author Affiliations
Larry L. Gordley, GATS, Inc. (United States)
Robert Earl Thompson, GATS, Inc. (United States)
Martin J. McHugh, GATS, Inc. (United States)
Ellis E. Remsberg, NASA Langley Research Ctr. (United States)
James M. Russell, Hampton Univ. (United States)
Brian E. Magill, Science Systems and Applications, Inc. (United States)

© SPIE. Terms of Use
Back to Top