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Optical Engineering

Vertical input transverse resonant cavity device structure for surface refractive index variation sensor
Author(s): Hideaki Okayama; Yusaku Naoi; Hirochika Nakajima
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Paper Abstract

A resonant cavity waveguide device structure is reported which uses a grating structure to couple the vertical incident light into the waveguide. A thin, high-refractive-index waveguide is used to attain high sensor sensitivity for the surface refractive index variation measurement.

Paper Details

Date Published: 1 January 2009
PDF: 6 pages
Opt. Eng. 48(1) 014602 doi: 10.1117/1.3067876
Published in: Optical Engineering Volume 48, Issue 1
Show Author Affiliations
Hideaki Okayama, Waseda Univ. (Japan)
Yusaku Naoi, Waseda Univ. (Japan)
Hirochika Nakajima, Waseda Univ. (Japan)

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