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Journal of Electronic Imaging

Image-based evaluation of seam puckering appearance
Author(s): Binjie Xin; George Baciu; Jinlian Hu
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Paper Abstract

We present the development of an objective evaluation method based on the integration of X-illumination, morphological fractal analysis and Bayes classifier that aims at characterizing the seam-puckering appearance. The experimental results in our research demonstrate that a highly significant correlation coefficient can be achieved between the estimated grades and the technician-generated grades; the presented method is insensitive to the color/texture of fabrics, thus showing the potential use of our newly developed method to evaluate the seam-puckering appearance objectively and quantitatively.

Paper Details

Date Published: 1 October 2008
PDF: 12 pages
J. Electron. Imaging. 17(4) 043025 doi: 10.1117/1.3041171
Published in: Journal of Electronic Imaging Volume 17, Issue 4
Show Author Affiliations
Binjie Xin, The Hong Kong Polytechnic Univ. (Hong Kong, China)
George Baciu, Hong Kong Univ. of Science and Technology (Hong Kong, China)
Jinlian Hu, The Hong Kong Polytechnic Univ. (Hong Kong, China)


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