Share Email Print

Journal of Electronic Imaging

Development and assessment of an integrated computer-aided detection scheme for digital microscopic images of metaphase chromosomes
Author(s): Xingwei Wang; Bin Zheng; Shibo Li; John J. Mulvihill; Hong Liu
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An integrated computer-aided detection (CAD) scheme was developed for detecting and classifying metaphase chromosomes. The CAD scheme's performance and robustness is assessed. This scheme includes an automatic metaphase-finding module and a karyotyping module, and it was applied to a testing database with 200 digital microscopic images. The automatic metaphase-finding module detects analyzable metaphase cells using a feature-based artificial neural network (ANN). The ANN-generated outputs are analyzed by a receiver operating characteristics (ROC) method, and the area under the ROC curve is 0.966. Then, the automatic karyotyping module classifies individual chromosomes of this cell into 24 types. In this module, a two-layer decision tree-based classifier with eight ANNs established in its connection nodes was optimized by a genetic algorithm. Chromosomes are first classified into seven groups by the ANN in the first layer. The chromosomes in these groups are then separately classified by seven ANNs into 24 types in the second layer. The classification accuracy is 94.5% in the first layer. Six ANNs achieved the accuracy above 95% and only one had lessened performance (80.6%) in the second layer. The overall classification accuracy is 91.5% as compared with 86.7% in the previous study using two independent datasets randomly acquired from our genetic laboratory. The results demonstrate that this automated scheme achieves high and robust performance in identification and classification of metaphase chromosomes.

Paper Details

Date Published: 1 October 2008
PDF: 9 pages
J. Electron. Imaging. 17(4) 043008 doi: 10.1117/1.3013459
Published in: Journal of Electronic Imaging Volume 17, Issue 4
Show Author Affiliations
Xingwei Wang, Univ. of Oklahoma (United States)
Bin Zheng, Univ. of Pittsburgh (United States)
Shibo Li, Oklahoma Medical Research Foundation (United States)
John J. Mulvihill, Univ. of Oklahoma Health Sciences Ctr. (United States)
Hong Liu, Univ. of Oklahoma (United States)

© SPIE. Terms of Use
Back to Top