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Optical Engineering

Light-emitting-diode inspection using a flatbed scanner
Author(s): Han-Yen Tan; Tuck Wah Ng
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Paper Abstract

There is a need to ensure that light-emitting diodes (LEDs) are performing well as they are increasingly used in demanding applications. In this work, we present an adapted usage of flatbed scanners to inspect LEDs. This offers the benefits of lower cost and higher measurement throughput than specialized equipment like goniophotometers. The technique is demonstrated to detect LED encapsulation defects, to identify low illumination and misaligned LEDs in arrays, and to evaluate angular color nonuniformity of white LEDs.

Paper Details

Date Published: 1 October 2008
PDF: 4 pages
Opt. Eng. 47(10) 103602 doi: 10.1117/1.2995991
Published in: Optical Engineering Volume 47, Issue 10
Show Author Affiliations
Han-Yen Tan, Monash Univ. (Australia)
Tuck Wah Ng, Monash Univ. (Australia)

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