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Optical Engineering

Effect of elliptical manufacture error of an axicon on the diffraction-free beam patterns
Author(s): Xiahui Zeng; Fengtie Wu
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Paper Abstract

Based on the generalized Huygens-Fresnel diffraction integral theory and the stationary-phase method, we analyze the influence on diffraction-free beam patterns of an elliptical manufacture error in an axicon. The numerical simulation is compared with the beam patterns photographed by using a CCD camera. Theoretical simulation and experimental results indicate that the intensity of the central spot decreases with increasing elliptical manufacture defect and propagation distance. Meanwhile, the bright rings around the central spot are gradually split into four or more symmetrical bright spots. The experimental results fit the theoretical simulation very well.

Paper Details

Date Published: 1 August 2008
PDF: 6 pages
Opt. Eng. 47(8) 083401 doi: 10.1117/1.2967867
Published in: Optical Engineering Volume 47, Issue 8
Show Author Affiliations
Xiahui Zeng, Shanghai Institute of Optics and Fine Mechanics (China)
Fengtie Wu, Huaqiao Univ. (China)


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