Share Email Print

Optical Engineering

Polarization mixing error in transmission ellipsometry with two acousto-optical modulators
Author(s): Yuanlong Deng; Jinlong Chai; Xuejin Li; Yubin Wu; Gang Xu
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A transmission ellipsometer with the configuration of modified Mach-Zehnder heterodyne interferometer is demonstrated. Two acousto-optical modulators are employed to generate a 20-kHz beat frequency. The scheme offers high resistance to environmental turbulence because of the interferometric components passing through the same path. A single layer of indium tin oxide on a glass substrate was measured, and an error up to several nanometers of the sample thickness is observed. The polarization mixing error is mainly due to the imperfection of polarizing beamsplitters (PBSs) and to the elliptical polarization and nonorthogonality of the light beams produced by the laser source and wave plates. The mechanism governing the error and its influence on measurement accuracy is analyzed with the Jones matrix method. In contrast with interferometric reflection ellipsometry using a Zeeman laser, the theoretical analysis indicates that only second-order error is introduced in this system. The elliptical polarization and nonorthogonality, occurring only before the light splitting, have little influence on measurement accuracy; the imperfection of PBSs is the major contributor to the polarization mixing error.

Paper Details

Date Published: 1 July 2008
PDF: 6 pages
Opt. Eng. 47(7) 075601 doi: 10.1117/1.2955770
Published in: Optical Engineering Volume 47, Issue 7
Show Author Affiliations
Yuanlong Deng, Shenzhen Univ. (China)
Jinlong Chai, Shenzhen Univ. (China)
Xuejin Li, Shenzhen Univ. (China)
Yubin Wu, Shenzhen Univ. (China)
Gang Xu, Shenzhen Univ. (China)

© SPIE. Terms of Use
Back to Top