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Optical Engineering

Line width measurement of semiconductor lasers using quantum interference in electromagnetically induced transparency: a quantum heterodyning method
Author(s): S. M. Iftiquar
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Paper Abstract

A technique is described in which electromagnetically induced transparency (EIT) spectra are used to measure laser line width. Two independent sets of EIT measurements are carried out in the presence of 85Rb and 87Rb atomic isotopes. Conventional self-heterodyning detection is used to obtain standard values of laser line width. A comparison shows that the estimated laser line widths in these measurements are very close to each other.

Paper Details

Date Published: 1 June 2008
PDF: 4 pages
Opt. Eng. 47(6) 064201 doi: 10.1117/1.2948312
Published in: Optical Engineering Volume 47, Issue 6
Show Author Affiliations
S. M. Iftiquar, Indian Institute of Science (India)


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