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Optical Engineering • Open Access

Optimal layout of fringe projection for three-dimensional measurements
Author(s): Victor S. Cheng; Rongqiang Yang; Chun Hui; Yazhu Chen

Paper Abstract

We optimize the layout of each light plane in a dual-view multistripe measurement system by employing spatial geometry analysis to avoid ambiguity. The imaging regions of every light plane can be labeled uniquely on two image planes within a certain measurement depth. Moreover, the flexible density of fringe patterns corresponding to the different measurement depths is immediately projected without the conventional coding procedure. Some experiments verify the effectiveness of the proposed method applied in high-resolution 3-D measurements.

Paper Details

Date Published: 1 May 2008
PDF: 3 pages
Opt. Eng. 47(5) 050503 doi: 10.1117/1.2931577
Published in: Optical Engineering Volume 47, Issue 5
Show Author Affiliations
Victor S. Cheng, Shanghai Jiao Tong Univ. (China)
Rongqiang Yang, Shanghai Jiao Tong Univ. (China)
Chun Hui, Shanghai Jiao Tong Univ. (China)
Yazhu Chen, Shanghai Jiao Tong Univ. (China)

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