Share Email Print
cover

Optical Engineering

Topological clustering and its application for discarding wide-baseline mismatches
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present a novel scheme for discarding wide-baseline mismatches. Based on a general two-frame wide-baseline matching model, the proposed algorithm first generates match clusters that are topologically invariable between frames, and then discards mismatches from clusters. Experimental results demonstrate that our algorithm can effectively extract high-precision scale-invariant feature transform (SIFT) matches from low-precision initial SIFT matches for wide-baseline image pairs. Furthermore, the algorithm always performs best or close to best in the comparison, indicating that it is more robust than other methods for discarding wide-baseline mismatches.

Paper Details

Date Published: 1 May 2008
PDF: 6 pages
Opt. Eng. 47(5) 057202 doi: 10.1117/1.2931504
Published in: Optical Engineering Volume 47, Issue 5
Show Author Affiliations
Yongtao Wang, Huazhong Univ. of Science and Technology (China)
Dazhi Zhang, Huazhong Univ. of Science and Technology (China)
Jinwen Tian, Huazhong Univ. of Science and Technology (China)


© SPIE. Terms of Use
Back to Top